Contribution Details
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Integrating imaging FTIR and secondary ion mass spectrometry for the analysis of embedded paint cross-sections
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Ron M.A. Heeren
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Jaap J. Boon, Petria Noble, Jørgen Wadum
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Scientific methods of examination of works of art
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Paper
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binding media, FTIR imaging, mass spectrometry, cross-section analysis, lead chloride, Rembrandt, lead soaps, inclusions
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English
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1999 Lyon
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ICOM Committee for Conservation 12th Triennial Meeting Lyon 29 August - 3 September 1999
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1-873936-92-3
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James & James (Science Publishers) Ltd
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ICOM-CC_1999_Lyon_39.pdf
Ron M.A. Heeren; Jaap J. Boon, Petria Noble, Jørgen Wadum. Integrating imaging FTIR and secondary ion mass spectrometry for the analysis of embedded paint cross-sections. In ICOM Committee for Conservation 12th Triennial Meeting Lyon 29 August - 3 September 1999, pg. Paris: International Council of Museums (ICOM-CC): ISBN: 1-873936-92-3
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