Contribution Details
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Application des Nouvelles Methodes de la Microscopie Electronique clans les Recherches Topographiques de la Pierre
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M. Kranz
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Not assigned
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Paper
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Français
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1972 Madrid
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ICOM Committee for Conservation 3rd Triennial Meeting Madrid Spain 2-7 October 1972
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International Council of Museums (ICOM)
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ICOM-CC_1972_Madrid_37.pdf
M. Kranz; . Application des Nouvelles Methodes de la Microscopie Electronique clans les Recherches Topographiques de la Pierre. In ICOM Committee for Conservation 3rd Triennial Meeting Madrid Spain 2-7 October 1972, pg. Paris: International Council of Museums (ICOM-CC): ISBN: